anx_II__table__5

X.A.IV.001 | Marine or terrestrial acoustic equipment, capable of detecting or locating underwater objects or features or positioning surface vessels or underwater vehicles; and specially designed components, other than those specified in the CML or in Regulation (EU) 2021/821. X.A.IV.002 | Optical Sensors as follows: a. Image intensifier tubes and specially designed components therefor, as follows: 1. Image intensifier tubes having all the following: a. A peak response in wavelength range exceeding 400 nm, but not exceeding 1 050 nm; b. A microchannel plate for electron image amplification with a hole pitch (centre-to-centre spacing) of less than 25 μm; and c. Having any of the following: 1. An S-20, S-25 or multialkali photocathode; or 2. A GaAs or GaInAs photocathode; 2. Specially designed microchannel plates having both of the following characteristics: a. 15 000 or more hollow tubes per plate; and b. Hole pitch (centre-to-centre spacing) of less than 25 μm. b. Direct view imaging equipment operating in the visible or infrared spectrum, incorporating image intensifier tubes having the characteristics listed in X.A.IV.002.a.1. X.A.IV.003 | Cameras as follows: a. Cameras that meet the criteria of Note 3 to 6A003.b.4. (9); b. Not used; X.A.IV.004 | Optics as follows: Note: X.A.IV.004 does not control optical filters with fixed air gaps or Lyot-type filters. a. Optical filters: 1. For wavelengths longer than 250 nm, comprised of multi-layer optical coatings and having either of the following: a. Bandwidths equal to or less than 1 nm Full Width Half Intensity (FWHI) and peak transmission of 90 % or more; or b. Bandwidths equal to or less than 0,1 nm FWHI and peak transmission of 50 % or more; 2. For wavelengths longer than 250 nm, and having all of the following: a. Tunable over a spectral range of 500 nm or more; b. Instantaneous optical bandpass of 1,25 nm or less; c. Wavelength resettable within 0,1 ms to an accuracy of 1 nm or better within the tunable spectral range; and d. A single peak transmission of 91 % or more; 3. Optical opacity switches (filters) with a field of view of 30o or wider and a response time equal to or less than 1 ns; b. “Fluoride fibre” cable, or optical fibres therefor, having an attenuation of less than 4 dB/km in the wavelength range exceeding 1 000 nm but not exceeding 3 000 nm; Technical Note: For the purpose of X.A.IV.004.b “Fluoride fibres” are fibres manufactured from bulk fluoride compounds. X.A.IV.005 | “Lasers” as follows: a. Carbon dioxide (CO2) “lasers” having any of the following: 1. A CW output power exceeding 10 kW; 2. A pulsed output with a “pulse duration” exceeding 10 μs; and a. An average output power exceeding 10 kW; or b. A pulsed “peak power” exceeding 100 kW; or 3. A pulsed output with a “pulse duration” equal to or less than 10 μs; and a. A pulse energy exceeding 5 J per pulse and “peak power” exceeding 2,5 kW; or b. An average output power exceeding 2,5 kW; b. Semiconductor lasers, as follows: 1. Individual, single-transverse mode semiconductor “lasers” having: a. An average output power exceeding 100 mW; or b. A wavelength exceeding 1 050 nm; 2. Individual, multiple-transverse mode semiconductor “lasers”, or arrays of individual semiconductor “lasers”, having a wave-length exceeding 1050 nm; c. Ruby “lasers” having an output energy exceeding 20 J per pulse; d. Non-“tunable” “pulsed lasers” having an output wavelength exceeding 975 nm but not exceeding 1 150 nm and having any of the following: 1. A “pulse duration” equal to or exceeding 1 ns but not exceeding 1 μs, and having any of the following: a. A single transverse mode output and having any of the following: 1. A “wall-plug efficiency” exceeding 12 % and an “average output power” exceeding 10 W and capable of operating at a pulse repetition frequency greater than 1 kHz; or 2. An “average output power” exceeding 20 W; or b. A multiple transverse mode output and having any of the following: 1. A “wall-plug efficiency” exceeding 18 % and an “average output power” exceeding 30W; 2. A “peak power” exceeding 200 MW; or 3. An “average output power” exceeding 50 W; or 2. A “pulse duration” exceeding 1 μs and having any of the following: a. A single transverse mode output and having any of the following: 1. A “wall-plug efficiency” exceeding 12 % and an “average output power” exceeding 10 W and capable of operating at a pulse repetition frequency greater than 1 kHz; or 2. An “average output power” exceeding 20 W; or b. A multiple transverse mode output and having any of the following: 1. A “wall-plug efficiency” exceeding 18 % and an “average output power” exceeding 30 W; or 2. An “average output power” exceeding 500 W; e. Non-“tunable” continuous wave “(CW) lasers”, having an output wavelength exceeding 975 nm but not exceeding 1 150 nm and having any of the following: 1. A single transverse mode output and having any of the following: a. A “wall-plug efficiency” exceeding 12 % and an “average output power” exceeding 10 W and capable of operating at a pulse repetition frequency greater than 1 kHz; or b. An “average output power” exceeding 50 W; or 2. A multiple transverse mode output and having any of the following: a. A “wall-plug efficiency” exceeding 18 % and an “average output power” exceeding 30 W; or b. An “average output power” exceeding 500 W; Note: X.A.IV.005.e.2.b does not control multiple transverse mode, industrial “lasers” with output power less than or equal to 2 kW with a total mass greater than 1 200kg. For the purpose of this note, total mass includes all components required to operate the “laser”, e.g., “laser”, power supply, heat exchanger, but excludes external optics for beam conditioning and/or delivery. f. Non-”tunable” “lasers”, having a wavelength exceeding 1 400 nm, but not exceeding 1 555 nm and having any of the following: 1. An output energy exceeding 100 mJ per pulse and a pulsed “peak power” exceeding 1 W; or 2. An average or CW output power exceeding 1 W; g. Free electron “lasers”. Technical Note: For the purpose of X.A.IV.005 “Wall-plug efficiency” is defined as the ratio of “laser” output power (or “average output power”) to total electrical input power required to operate the “laser”, including the power supply/conditioning and thermal conditioning/heat exchanger. X.A.IV.006 | “Magnetometers”, “Superconductive” electromagnetic sensors, and specially designed components therefor, as follows: a. “Magnetometers”, other than those specified in the CML or in Regulation (EU) 2021/821, having a “sensitivity” lower (better) than 1,0 nT (rms) per square root Hz. Technical Note: For the purposes of X.A.IV.006.a, “sensitivity” (noise level) is the root mean square of the device-limited noise floor which is the lowest signal that can be measured. b. “Superconductive” electromagnetic sensors, components manufactured from “superconductive” materials: 1. Designed for operation at temperatures below the “critical temperature” of at least one of their “superconductive” constituents (including Josephson effect devices or “superconductive” quantum interference devices (SQUIDS)); 2. Designed for sensing electromagnetic field variations at frequencies of 1 kHz or less; and 3. Having any of the following characteristics: a. Incorporating thin-film SQUIDS with a minimum feature size of less than 2 μm and with associated input and output coupling circuits; b. Designed to operate with a magnetic field slew rate exceeding 1 x 106 magnetic flux quanta per second; c. Designed to function without magnetic shielding in the earth’s ambient magnetic field; or d. Having a temperature coefficient less (smaller) than 0,1 magnetic flux quantum/K. X.A.IV.007 | Gravity meters (gravimeters) for ground use, other than those specified in the CML or in Regulation (EU) 2021/821, as follows: a. Having a static accuracy of less (better) than 100 μGal; or b. Being of the quartz element (Worden) type. X.A.IV.008 | Radar systems, equipment and major components, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor, as follows: a. Airborne radar equipment, other than those specified in the CML or in Regulation (EU) 2021/821, and specially designed components therefor; b. “Space-qualified” “laser” radar or Light Detection and Ranging (LIDAR) equipment specially designed for surveying or for meteorological observation; c. Millimeter wave enhanced vision radar imaging systems specially designed for rotary wing aircraft and having all of the following: 1. Operates at a frequency of 94 GHz; 2. An average output power of less than 20 mW; 3. Radar beam width of 1 degree; and 4. Operating range equal to or greater than 1 500 m. X.A.IV.009 | Specific processing equipment, as follows: a. Seismic detection equipment not controlled by X.A.IV.009.c; b. Radiation hardened TV cameras, other than those specified in the CML or in Regulation (EU) 2021/821; or c. Seismic intrusion detection systems that detect, classify and determine the bearing on the source of a detected signal. X.B.IV.001 | Equipment, including tools, dies, fixtures or gauges, and other specially designed components and accessories therefor, specially designed or modified for any of the following: a. For the manufacture or inspection of: 1. Free electron “laser” magnet wigglers; 2. Free electron “laser” photo injectors; b. For the adjustment, to required tolerances, of the longitudinal magnetic field of free electron “lasers”. X.C.IV.001 | Optical sensing fibres that are modified structurally to have a “beat length” of less than 500 mm (high birefringence) or optical sensor materials not described in 6C002.b (10) and having a zinc content of equal to or more than 6 % by “mole fraction”. Technical Note: For the purpose of X.C.IV.001: 1) “Mole fraction” is defined as the ratio of moles of ZnTe to the sum of the moles of CdTe and ZnTe present in the crystal. 2) “Beat length” is the distance over which two orthogonally polarised signals, initially in phase, must pass in order to achieve a 2 Pi radian(s) phase difference. X.C.IV.002 | Optical materials, as follows: a. Low optical absorption materials, as follows: 1. Bulk fluoride compounds containing ingredients with a purity of 99,999 % or better; or Note: X.C.IV.002.a.1 controls fluorides of zirconium or aluminium and variants. 2. Bulk fluoride glass made from compounds controlled by 6C004.e.1 (11); b. “Optical fibre preforms” made from bulk fluoride compounds containing ingredients with a purity of 99,999 % or better, specially designed for the manufacture of “fluoride fibres” controlled by X.A.IV.004.b. Technical Note: For the purpose of X.C.IV.002: 1) “Fluoride fibres” are fibres manufactured from bulk fluoride compounds. 2) “Optical fibre preforms” are bars, ingots, or rods of glass, plastic or other materials that have been specially processed for use in fabricating optical fibres. The characteristics of the preform determine the basic parameters of the resultant drawn optical fibres. X.D.IV.001 | “Software”, other than those specified in the CML or in Regulation (EU) 2021/821, specially designed for the “development”, “production”, or “use” of goods controlled by 6A002, 6A003 (12), X.A.IV.001, X.A.IV.006, X.A.IV.007, or X.A.IV.008. X.D.IV.002 | “Software” specially designed for the “development” or “production”of equipment controlled by X.A.IV.002, X.A.IV.004, or X.A.IV.005. X.D.IV.003 | Other “software”, as follows: a. Air Traffic Control (ATC) “software” application “programs” hosted on general purpose computers located at Air Traffic Control centres, and capable of automatically handing over primary radar target data (if not correlated with secondary surveillance radar (SSR) data) from the host ATC centre to another ATC centre; b. “Software” specially designed for seismic intrusion detection systems in X.A.IV.009.c; or c. “Source code” specially designed for seismic intrusion detection systems in X.A.IV.009.c. X.E.IV.001 | “Technology” for the “development”, “production” or “use” of equipment controlled by X.A.IV.001, X.A.IV.006, X.A.IV.007, X.A.IV.008 or X.A.IV.009.c. X.E.IV.002 | “Technology” for the “development” or “production” of equipment, materials or “software” controlled by X.A.IV.002, X.A.IV.004, or X.A.IV.005, X.B.IV.001, X.C.IV.001, X.C.IV.002, or X.D.IV.003. X.E.IV.003 | Other “technology” as follows: a. Optical fabrication technologies for serially producing optical components at a rate exceeding 10 m2 of surface area per year on any single spindle and having all of the following: 1. Area exceeding 1 m2; and 2. Surface figure exceeding λ/10 (rms) at the designed wavelength; b. “Technology” for optical filters with a bandwidth equal to or less than 10 nm, a field of view (FOV) exceeding 40o and a resolution exceeding 0,75 line pairs per milliradian; c. “Technology” for the “development” or “production” of cameras controlled by X.A.IV.003; d. “Technology” “required” for the “development” or “production” of non-triaxial fluxgate “magnetometers” or non-triaxial fluxgate “magnetometer” systems, having any of the following: 1. “Sensitivity” lower (better) than 0,05 nT (rms) per square root Hz at frequencies of less than 1 Hz; or 2. “Sensitivity” lower (better) than 1 x 10-3 nT (rms) per square root Hz at frequencies of 1 Hz or more. e. “Technology” “required” for the “development” or “production” of infrared up-conversion devices having all of the following: 1. A response in the wavelength range exceeding 700 nm but not exceeding 1 500 nm; and 2. A combination of an infrared photodetector, light emitting diode (OLED), and nanocrystal to convert infrared light into visible light. Technical Note: For the purposes of X.E.IV.003, “sensitivity” (or noise level) is the root mean square of the device-limited noise floor which is the lowest signal that can be measured.

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Source: EUR-Lex (Cellar) · retrieved 2026-10-17 · Text as adopted (Official Journal); later amendments are not incorporated in this text.