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anx_III__table__65

Council Regulation (EU) 2025/395 of 24 February 2025 amending Regulation (EU) No 833/2014 concerning restrictive measures in view of Russia’s actions destabilising the situation in Ukraine · European Union

X.A.VIII.003 | Microscopes, related equipment and detectors as follows: a. Scanning electron microscopes (SEM); b. Scanning auger microscopes; c. Transmission electron microscopes (TEM); d. Atomic force microscopes (AFM); e. Scanning force microscopes (SFM); f. Equipment and detectors, specially designed for use with the microscopes specified in X.A.VIII.003.a to X.A.VIII.0003.e, employing any of the following material analysis techniques: 1. X-ray photo spectroscopy (XPS); 2. Energy-dispersive X-ray spectroscopy (EDX, EDS); or 3. Electron spectroscopy for chemical analysis (ESCA).

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Source: EUR-Lex (Cellar) · retrieved 2026-10-15 · Text as adopted (Official Journal); later amendments are not incorporated in this text.