Schedule 2E, Part 2, paragraph 8

Microscopes, related equipment and detectors, as follows— scanning electron microscopes (SEM); scanning auger microscopes; transmission electron microscopes (TEM); atomic force microscopes (AFM); scanning force microscopes (SFM); equipment and detectors specially designed for use with the microscopes specified in sub-paragraphs (a) to (e), employing any of the following— X-ray photo spectroscopy (XPS); energy-dispersive X-ray spectroscopy (EDX, EDS); electron back scatter detector (EBSD) systems; electron spectroscopy for chemical analysis (ESCA).

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Source: legislation.gov.uk · retrieved 2026-08-30